by Eiji Takeda, Cary Y. Yang, Akemi Miura-Hamada · Academic Press · tapa blanda · ISBN 9780123958044
VAT included
Hamelyn quality guarantee · checked and verified, or your money back
The exploding number of uses for ultrafast, ultrasmall integrated circuits has increased the importance of hot-carrier effects in manufacturing as well as for other technological applications. This book, derived from Dr. Takeda's original work, provides a fundamental and comprehensive text on this increasingly important topic, encompassing the latest research, the basics of MOS devices, and practical considerations for real-world implementation.
